大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 IEEE Ultrasonics 的图书(共606本)

Proceedings of the Workshop on Picture Data Description and Management, August 27-28, 1980, Asilomar, Calif

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索取号：TN27-53/E904/1980
作者：Workshop on Picture Data Description and Management (1980 : Asilomar、 Calif.)、IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis.、
出版社：New York IEEE Los Alamitos, CA : The Society, c1980.

14th Symposium on Logic in Computer Science : proceedings : July 2-5, 1999, Trento, Italy

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索取号：TP301-53/E991/14
作者：Symposium on Logic in Computer Science (14th : 1999 : Trento、 Italy)、IEEE Computer Society. Technical Committee on Mathematical Foundations of Computing.、
出版社：Los Alamitos, Calif : IEEE Computer Society Press, c1999.

Digest : 1979 IEEE MTT-S International Microwave Symposium

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索取号：TN019.2-7/E801/1979
作者：IEEE MTT-S International Microwave Symposium (1979 : Orlando、 Fla.)、Tracy、 John E、Institute of Electrical and Electronics Engineers、IEEE Microwave Theory and Techniques Society、
出版社：New York : Institute of Electrical and Electronics Engineers, c1979

Proceedings [electronic resource] : energy and information technologies in the Southeast : Southeastcon, April 1-4, 1990, conference and exhibit, Doubletree Hotel, New Orleans, LA. v. 1

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索取号：TN1-53/E901/1990.1
作者：IEEE Southeastcon (1990 : New Orleans、 La.)、IEEE Xplore (Online service)、Institute of Electrical and Electronics Engineers. Region 3.、
出版社：New York, NY : Institute of Electrical and Electronics Engineers, c1989

Proceedings [electronic resource] : energy and information technologies in the Southeast : Southeastcon, April 1-4, 1990, conference and exhibit, Doubletree Hotel, New Orleans, LA. v. 2

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索取号：TN1-53/E901/1990.2
作者：IEEE Southeastcon (1990 : New Orleans、 La.)、IEEE Xplore (Online service)、Institute of Electrical and Electronics Engineers. Region 3.、
出版社：New York, NY : Institute of Electrical and Electronics Engineers, c1989

Proceedings [electronic resource] : energy and information technologies in the Southeast : Southeastcon, April 1-4, 1990, conference and exhibit, Doubletree Hotel, New Orleans, LA. v. 3

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索取号：TN1-53/E901/1990.3
作者：IEEE Southeastcon (1990 : New Orleans、 La.)、IEEE Xplore (Online service)、Institute of Electrical and Electronics Engineers. Region 3.、
出版社：New York, NY : Institute of Electrical and Electronics Engineers, c1989

Conference proceedings

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索取号：TN1-53/E901/1987.1
作者：IEEE Southeastcon (1987 : Tampa、 Fla.)、Institute of Electrical and Electronics Engineers. Region 3.、
出版社：New York, NY : Institute of Electrical and Electronics Engineers, c1987.

Conference proceedings

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索取号：TN1-53/E901/1987.2
作者：IEEE Southeastcon (1987 : Tampa、 Fla.)、Institute of Electrical and Electronics Engineers. Region 3.、
出版社：New York, NY : Institute of Electrical and Electronics Engineers, c1987.

NASECODE V [electronic resource] : proceedings of the Fifth International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits : 17-19 June 1987, Trinity College, Dublin, Ireland

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索取号：TN303-53/E902/5
作者：NASECODE Conference (5th : 1987 : Trinity College、 Dublin、 Ireland)、IEEE Xplore (Online service)、Miller、 John J. H.、
出版社：Dún Laoghaire : Boole, 1987

Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980

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索取号：TM93-53/E902/11
作者：Test Conference (11th : 1980 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、
出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, 1980.

Quality productivity profit : digest of papers : 1982 International Test Conference, November 15-18, 1982

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索取号：TM93-53/E901/1982
作者：International Test Conference (1982)、IEEE Computer Society. Test Technology Committee.、International Test Foundation.、IEEE Computer Society.、IEEE Computer Society. Philadelphia Section.、
出版社：Silver Spring, MD (1109 Spring St., Suite 300) : IEEE Computer Society Press, 1982.

Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983

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索取号：TM93-53/E901/1983
作者：International Test Conference (14th : 1983 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、
出版社：Silver Spring, MD : IEEE Computer Society Press, 1983.

1980 International Optical Computing Conference, April 8-9, 1980, Washington, D.C.

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索取号：TH74-55/E901/231
作者：International Optical Computing Conference、 Washington、 D.C.、 1980.、Rhodes、 William T.、IEEE Computer Society.、Society of Photo-optical Instrumentation Engineers.、
出版社：Bellingham, Wash. : Society of Photo-Optical Instrumentation Engineers, 1980.

1980 International Optical Computing Conference, April 8-9, 1980, Washington, D.C.

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索取号：TH74-55/E901/232.2
作者：International Optical Computing Conference、 Washington、 D.C.、 1980.、Rhodes、 William T.、IEEE Computer Society.、Society of Photo-optical Instrumentation Engineers.、
出版社：Bellingham, Wash. : Society of Photo-Optical Instrumentation Engineers, c1980.

Proceedings IECON '87 : 1987 International Conference on Industrial Electronics, Control, and Instrumentation, Cambridge, Massachusetts, November 3-6, 1987

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索取号：TH74-55/E901/855
作者：International Conference on Industrial Electronics、 Control、 and Instrumentation (13th : 1987 : Cambridge、 Mass.)、IEEE Industrial Electronics Society.、Keisoku Jid̄О Seigyo Gakkai (Japan)、Society of Photo-optical Instrumentation Engineers.、
出版社：New York, N.Y. : IEEE ; Piscataway, NJ : Order from IEEE Service Center, Publications Sale Dept., 1987.

Proceedings : Sixth Conference on Computer Applications in Radiology & Computer/Aided Analysis of Radiological Images

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索取号：R81-53/E801/1979
作者：Conference on Computer Applications in Radiology & Computer/Aided Analysis of Radiological Images、 6th、 Newport Beach、 Calif. 1979.、American College of Radiology.、IEEE Computer Society.、
出版社：New York, NY : Institute of Electrical and Electronics Engineers ; Long Beach, CA : additional copies available from The Society, c1979.